Publications
Please see my full list of publications.
![Destructive Reverse Bias in Perovskite Tandem Modules](/assets/components/phpthumbof/cache/Destructive_Reverse_Bias_Graphical_Abstract.9e75d57c5bc42f6f9b22877bd7ea4058.jpg)
Destructive Reverse Bias in Perovskite Tandem Modules
Jun 11, 2020
|We demonstrate how perovskite hysteresis can result in permanent reductions in power output in perovskite/silicon tandem modules—including irreversible hotspot-induced damage—from only brief periods of shading.
![Lifetime energy yield and economic viability of perovskite/silicon tandem modules](/assets/components/phpthumbof/cache/PerovskiteDegradationModuleYield.9e75d57c5bc42f6f9b22877bd7ea4058.jpg)
Lifetime energy yield and economic viability of perovskite/silicon tandem modules
Apr 29, 2019
|Impact of perovskite solar cell degradation on the lifetime energy yield and economic viability of perovskite/silicon tandem modules
![Analysis of Hotspots in Half Cell Modules Undetected by Current Test Standards](/assets/components/phpthumbof/cache/HalfCellHotspot2019.9e75d57c5bc42f6f9b22877bd7ea4058.jpg)
Analysis of Hotspots in Half Cell Modules Undetected by Current Test Standards
Mar 07, 2019
|Hotspots are a major source of failure for photovoltaic modules in the field. The current standard for module testing IEC 61215-2 can leave critical hotspots undetected in half-cut solar cell modules.
![2-D Hot Spot Temperature Simulation for PV Modules](/assets/components/phpthumbof/cache/2D_hotspot.9e75d57c5bc42f6f9b22877bd7ea4058.jpg)
2-D Hot Spot Temperature Simulation for PV Modules
Jul 24, 2018
|A two‐step method to simulate the spatially resolved temperature of a partially shaded cell in a crystalline silicon photovoltaic (PV) module is presented and tested.
![Hotspot Modelling of Half-Cell and Full-Cell Module](/assets/components/phpthumbof/cache/1804_HotSpot1.9e75d57c5bc42f6f9b22877bd7ea4058.jpg)
Hotspot Modelling of Half-Cell and Full-Cell Module
Apr 11, 2018
|The impact of partial shading on cell operating current, voltage, and temperature is simulated, for a half-cell module with series-parallel-series connections and for the conventional full-cell module.